Issues for interfaces in polycrystals<br/><br/><br/><br/>

Friday, November 5, 2004 - 2:00pm - 2:45pm
EE/CS 3-180
David Kinderlehrer (Carnegie-Mellon University)
Nearly all technologically useful materials are polycrystalline. Their ability to meet system level specifications of performance and reliability is influenced by the types of grain boundaries present and their connectivity. We explore the role of mesoscale theory and experiment designed to establish predictive models of material behavior. Traditionally we have studied geometry-based statistics, like relative area statistics or distributions of numbers of sides of grains. With the advent of automated data acquisition we now have the possibility of obtaining large quantities of both geometric and crystallographic information. In particular we shall discuss two new results which lead to the astonishing conclusion that a polycrystal may leave its footprint in a microsopic scan: simple analysis of the scan reveals the identity of the material.

This is part of the CMU MRSEC project.