Interpreting Photon and Electron Detections to Form Images

Monday, October 14, 2019 - 10:00am - 10:45am
Keller 3-180
Vivek Goyal (Boston University)
Single-photon lidar systems form range and reflectivity images using detectors with single-photon sensitivity. Some focused ion beam (FIB) and electron microscopy systems use direct detection of secondary electrons to maximize resolution. This talk will discuss recent results on the interpretation of single-photon and single-electron data that yield improved mitigation of detector dead time and a principle for dose reduction in FIB microscopy with no degradation of image quality.

The full presentation can be found here:

Related paper identifiers: 10.1126/science.1246775 10.1109/TSP.2015.2453093 10.1364/OE.24.001873 10.1038/ncomms12046 10.1109/TSP.2017.2706028 10.1126/science.aat2298 10.1038/s41586-018-0868-6 10.1103/PhysRevA.99.063809 10.1109/TSP.2019.2914891 10.1109/TCI.2019.2913108 arxiv:1906.03285